POSITRON STUDY OF DEFECTS IN TiNi ALLOYS

• 来源期刊: 中国物理(海外版)
• 年，卷（期）: 2000,（3）
• 页码范围: 216-221
• 页数: 6页
• 语种: 英文

摘要

A number of TiNi samples with different compositions and states were measured by positron annihilation technique. And microdefects and the influence of them on shape memory effect were analyzed, giving some valuable information for the study of technological processes of preparing TiNi functional shape memory devices.