Monolayer Oscillation Observed by an Oblique-Incidence Reflectance Difference Technique for the Epitaxial Growth of Oxides

• 来源期刊: 中国物理快报(英文版)
• 学科: 物理学
• 年，卷（期）: 2001,（5）
• 所属期刊栏目: CONDENSED MATTER：STRUCTURE，MECHANICAL
• 页码范围: 665-667
• 页数: 3页
• 分类号: O4
• 语种: 英文

摘要

We report the optical oscillations with monolayer periodicity observed by an oblique-incidence reflectance difference (OIRD) technique on the epitaxial growth of Nb-doped SrTiO3 on SrTiOs substrate. The periodicity was verified by the simultaneously measured reflection high-energy electron diffraction intensity oscillations. The OIRD oscillation damps during deposition, but can recover after the growth is interrupted for some time. We interpret the optical oscillations as a result of the periodic changes of the surface morphologies due to the two dimensional layer-by-layer growth of thin films.