Remeasurement of the Half-Life of 79Se with the Projectile X-Ray Detection Method

• 来源期刊: 中国物理快报（英文版）
• 学科: 物理学
• 年，卷（期）: 2001,（6）
• 页码范围: 746-749
• 页数: 4页
• 分类号: O4
• 语种: 英文

摘要

Remeasurement of the half-life of 79Se has been carried out with projectile x-ray detection (PXD) in acceleratormass spectrometry. We made two major improvements over our earlier 79 Se half-life determination [Nucl. Instrum.Methods B 123 (1997)403].Firstly,the PXD tec hnique has been used for separation of 79Se and 75Se from 79Br and 75As isobars respectively. Secondly, the half-life of 79 Se has been measured relative to the known precise half-lifeof 75Se(119.79-±0. 04d). A more reliable half-life of 79Se measured with the PXD technique is (2.95±0.38)×10 5 y,about a factor of one third lower than the previous value, 1.1 × 10 6 y. The problems in the previous measurementare discussed.