Twin-layer films of copper phthalocyanine and amorphous titanyl or vanadyl phthalocyanine--an x-ray photoelectron spectroscopic study

• 来源期刊: 中国物理（英文版）
• 学科: 物理学
• 关键词: phthalocyanine x-ray photoemission spectra annealing Ar+ bombardment
• 年，卷（期）: 2002,（4）
• 页码范围: 393-398
• 页数: 6页
• 分类号: O4
• 语种: 英文

摘要

Metallophthalocyanine (MPc) twin-layer thin films on glass substrates, consisting of copper phthalocyanine (CuPc)overlayer and amorphous vanatyl phthalocyanine (VOPc) as well as titanyl phthalocyanine (TiOPc) buffers, were found to have different gas sensing characteristics. These twin-layer thin films were studied using x-ray photoemission spectroscopy. Photoelectrons of either Ti core levels were found to be present at the surface, indicating the existence of possible molecular migrations.The stability of the twin-layers under thermal annealing up to a maximum temperature of 250℃ and low-energy Aridprn bombardment was also examined and compared with that of CuPc directly grown on the substrates. We concluded that the twin-layer structures were thermally fairly stable. Ar ion bombardment,however, caused substantial damage to the Pc ligands and a reduction of the valence state of the central Cu atoms.