InSitu Plane-View and Cross-Sectional Transmission Electron Microscopy of Fractal Formation in Au/a-Ge Bilayer Films

• 来源期刊: 中国物理快报（英文版）
• 学科: 物理学
• 年，卷（期）: 2002,（6）
• 页码范围: 828-831
• 页数: 4页
• 分类号: O4
• 语种: 英文

摘要

Fractal crystallization in Au/a-Ge bilayer films has been studied by in situ plane-view and cross-sectional transmission electron microscopy. The experimental evidence suggests that the fractal crystallization is controlled by both diffusion and reaction processes. The growth kinetics analysis indicates that both diffusion-limited aggregation and random successive nucleation mechanisms play an important role in fractal crystallization in Au/a-Ge bilayer films.