Characteristics of Photoelectron Decay of Silver Halide Microcrystal Illuminated by a Short Pulse Laser

• 来源期刊: 中国物理快报（英文版）
• 学科: 工学
• 年，卷（期）: 2002,（3）
• 页码范围: 429-431
• 页数: 3页
• 分类号: TN24
• 语种: 英文

摘要

A YA G supershort pulse laser (355nm, 35ps is used as an exposure source and the microwvave dielectric spectrum technique is used to quickly detect the photoelectron decay process in AgX microcrystals, because the free photoelectron lifetime and decay process can decide the sensitivity and other efficiencies of silver halide material.The result shows that the free photoelectron average lifetimes of Kodak-l00 and Fuji-l00 colour film samples are 8.5 and 9.5ns, respectively.