A Very Fast Pulsed Electron Gun for （e, 2e） and （e, 3e） Studies

• 作者: CaoShiping MaXinwen ShaShan ZhuXiaolong LiuHuipin
• 来源期刊: 近代物理研究所和兰州重离子加速器实验室年报：英文版
• 学科: 物理学
• 关键词: 反作用显微镜 离子-原子/分子动力学 散射角 脉冲电子枪
• 年，卷（期）: 2003,（1）
• 页码范围: 95
• 页数: 1页
• 分类号: O561.5

摘要

Reaction microscope is a powerful tool for studying ion-atom/molecule dynamics, it can also be employed to investigate electron impact ionization processes. Traditionally these processes are studied by using the (e, 2e) or (e, 3e) techniques, most data are collected for single ionization and for very small scattering angles, i.e. (e, 2e), experimental data of double ionization (e, 3e)[1] and multiple ionization are scarce, because in most cases the efficiencies (mainly determined by solid angles) are extremely small for (e, 3e) processes, about 10^-7～10^-9. On the other hand, the new technique-reaction microscope can detect mutli-fragments in one collision with very