Ion Beam Extraction Study on LECR3 Source

• 作者: Sun Liangting Cao Yun Zhao Hongwei Feng Yucheng Li Jinyu Zhang Zimin Li Jie Zhao Huanyu
• 来源期刊: 近代物理研究所和兰州重离子加速器实验室年报：英文版
• 学科: 工学
• 关键词: 离子束 提取 检测分析仪 ECR离子源 垂直方向 高电荷态 发射度 ESS
• 年，卷（期）: 2004,（1）
• 页码范围: 167
• 页数: 1页
• 分类号: TL503.3

摘要

<正>An ESS (Electric-Sweep Scanner) system has been recently developed in IMP to detect the emittance of the analyzed ion beam at both the vertical and horizontal directions with an error less than 10%. With such an instrument, we have successfully measured the beam emittance of the ion beam extracted from LECR3 source. LECR3 source is a high performance ECR ion source which can deliver intense medium charge state ion beams and high charge state ion beams. The LEBT line of LECR3 is designed specially for the two atomic and material research experimental terminals. Two ESS systems are mounted behind the analyzer magnet to detect the analyzed ion beam emittance at both the vertical and horizontal directions.