[篇名] ANALYSIS OF LOCAL DEFECTS IN SURFACE FILMS ON COMMERCIAL ALLOYS USING CONDUCTIVE ATOMIC FORCE MICROSCOPY (C-AFM), [篇名] Annealing-Induced Properties of Al-N-M (M: Co, Fe) Thin Films, [篇名] Anodic oscillatory behavior and film formation on indium phosphide, [篇名] Bias-temperature instabilities of polysilicon gate HfO{sub}2 MOSFETs, [ 篇名] Commercialization of a Silicon Nitridc Co-Fire Through (SINCOFT) process for manufacturing high efficiency mono-crystalline silicon solar cells, [篇名] Copper CMP for dual damascene technology some considerations on the mechanism of Cu removal.