Observation of MWCNTs with low-energy electron point source microscope

• 来源期刊: 中国物理（英文版）
• 关键词: LEEPS microscope field emission carbon nanotube
• 年，卷（期）: 2006,（7）
• 页码范围: 1558-1562
• 页数: 5页
• 语种: 英文

摘要

The low-energy electron point source (LEEPS) microscope, which creates enlarged projection images with lowenergy field emission electron beams, can be used to observe the projection image of nano-scale samples and to characterize the coherence of the field emission beam. In this paper we report the design and test operation performance of a home-made LEEPS microscope. Multi-walled carbon nanotubes (MWCNTs) synthesized by the CVD method were observed by LEEPS microscope using a conventional tungsten tip, and projection images with the magnification of up to 104 was obtained. The resolution of the acquired images is ～10 nm. A higher resolution and a larger magnification can be expected when the AC magnetic field inside the equipment is shielded and the vibration of the instrument reduced.