Double Electron Processes in Collisions of Partially Stripped Ions Cq+(q=1-4) with Helium

• 来源期刊: 中国物理快报（英文版）
• 年，卷（期）: 2007,（1）
• 页码范围: 94-96
• 页数: 3页
• 语种: 英文

摘要

The multi-electron processes are investigated for 17.9-120 keV/u C1+, 30-323 keV/u C2+, 120-438 keV/u C3+,287-480 keV/u C4+ incident on a helium target. The cross-section ratios of double electron (DE) process to the total of the single electron (SE) and the double electron process (i.e. SE+DE), the direct double electron (DDI)to the direct single ionization (DSI) as well as the contributions of DDI to DE and of TI to DE are measured using coincidence techniques. The energy and charge state dependences of the measured cross-section ratios are studied and discussed.