Development of the Technique for Fabricating Submicron Moiré Gratings on Metal Materials Using Focused Ion Beam Milling

• 来源期刊: 中国物理快报（英文版）
• 年，卷（期）: 2007,（9）
• 页码范围: 2521-2524
• 页数: 4页
• 语种: 英文

摘要

A focused gallium ion (Ga+) beam is used to fabricate micro/submicron spacing gratings on the surface of porous NiTi shape memory alloy (SMA). The crossing type of gratings with double-frequency (25001/mm and 50001/mm)using the focused ion beam (FIB) milling are successfully produced in a combination mode or superposition are obtained to study the micro-scale deformation of porous NiTi SMA. The grating fabrication technique is discussed in detail. The experimental results verify the feasibility of fabricating high frequency grating on metal surface using FIB milling.