Comparison between photoluminescence spectroscopy and photoreflectance spectroscopy in CuGaSe2 epilayer

• 来源期刊: 中国物理B（英文版）
• 关键词: photoluminescence photoreflectance comparison CuGaSe2
• 年，卷（期）: 2008,（4）
• 页码范围: 1454-1460
• 页数: 7页
• 语种: 英文

摘要

Photoluminescence (PL) spectroscopy and photoreflectance (PR) spectroscopy are very useful techniques for studying the properties of materials. In this paper, the same material of Cu-rich metal-organic vapour phase epitaxy (MOVPE)grown CuGaSe2 layer is investigated in a temperature range from 20 to 300 K to compare these two techniques. Both PL and PR spectra appear red shifted, less intense and broadened. The temperature dependence of interband transitions is studied by using the Manoogian-Leclerc equation. The values of the band gap energy at T=O K and the effective phonon temperature are estimated. The temperature dependences of intensities and broadenings of PL and PR spectral lines are also analysed. Based on the results of the comparison, the features and applications of the PL and PR can be shown in detail.