An on-line remote supervisory system for microparticles based on image analysis

• 来源期刊: 光电子快报（英文版）
• 年，卷（期）: 2011,（6）
• 页码范围: 466-469
• 页数: 4页
• 语种: 英文
• DOI: 10.1007/s11801-011-0103-2

摘要

A new on-line remote particle analysis system based on image processing has been developed to measure microparticles.The system is composed of particle collector sensor (PCS),particle image sensor (PIS),image remote wansmit module and image processing system.Then some details of image processing are discussed.The main advantage of this system is more convenient in particle sample collection and particle image acquisition.The particle size can be obtained using the system with a deviation abot less than 1 μm,and the particle number can be obtained without deviation,The developed system is also convenient and versatile for other analyses of microparticle for academic and industrial application.