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摘要:
In this work we are interested in studying the effect of the heat treatments on the dopant segregation at the grain boundaries in the polycrystalline silicon films. The obtained results have shown that the heat treatments reduce the number of segregation sites at the grains boundaries, and consequently they limit the structural changes that can appear there and the quantity of the dope atoms that can accumulate in these boundaries. In addition they are more and more dopant that are found inside the grains when the temperature of the heat treatment increases. On the other hand, we established that the arsenic atoms have a strong tendency to the segregation than the boron atoms, and we have noticed a strong migration of arsenic atoms from the boundaries towards the grains under the effect of the heat treatments. It was also shown that the segregation of arsenic atoms at the grains boundaries is about 4 times higher than that of the boron atoms.
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篇名 Effect of the Heat Treatments on the Dopes Segregation in Polycrystalline Silicon Films
来源期刊 现代物理(英文) 学科 医学
关键词 SEGREGATION Grains Boundaries HEAT TREATMENTS POLYCRYSTALLINE SILICON
年,卷(期) 2012,(9) 所属期刊栏目
研究方向 页码范围 1046-1049
页数 4页 分类号 R73
字数 语种
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研究主题发展历程
节点文献
SEGREGATION
Grains
Boundaries
HEAT
TREATMENTS
POLYCRYSTALLINE
SILICON
研究起点
研究来源
研究分支
研究去脉
引文网络交叉学科
相关学者/机构
期刊影响力
现代物理(英文)
月刊
2153-1196
武汉市江夏区汤逊湖北路38号光谷总部空间
出版文献量(篇)
1826
总下载数(次)
0
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0
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