| 篇名 | Analytical model including the fringing-induced barrier lowering effect for a dual-material surrounding-gate MOSFET with a high-K gate dielectric | ||
| 来源期刊 | 中国物理B(英文版) | 学科 | |
| 关键词 | high-k gate dielectric fringing-induced barrier lowering analytical model | ||
| 年,卷(期) | 2012,(4) | 所属期刊栏目 | |
| 研究方向 | 页码范围 | 605-611 | |
| 页数 | 7页 | 分类号 | |
| 字数 | 语种 | 英文 | |
| DOI | 10.1088/1674-1056/21/4/048501 | ||