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摘要:
This paper describes a novel time domain noise model for voltage controlled oscillators that accurately and efficiently predicts both tuning behavior and phase noise performance. The proposed method is based on device level flicker and thermal noise models that have been developed in Simulink and although the case study is a multiple feedback four delay cell architecture it could easily be extended to any similar topology. The strength of the approach is verified through comparison with post layout simulation results from a commercial simulator and measured results from a 120 nm fabricated prototype chip. Furthermore, the effect of control voltage flicker noise on oscillator output phase noise is also investigated as an example application of the model. Transient simulation based noise analysis has the strong advantage that noise performance of higher level systems such as phase locked loops can be easily determined over a realistic acquisition and locking process yielding more accurate and reliable results.
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篇名 A Novel Time Domain Noise Model for Voltage Controlled Oscillators
来源期刊 电路与系统(英文) 学科 医学
关键词 VOLTAGE CONTROLLED Oscillators Noise MODEL SIMULATION
年,卷(期) 2013,(1) 所属期刊栏目
研究方向 页码范围 97-105
页数 9页 分类号 R73
字数 语种
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研究主题发展历程
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VOLTAGE
CONTROLLED
Oscillators
Noise
MODEL
SIMULATION
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期刊影响力
电路与系统(英文)
月刊
2153-1285
武汉市江夏区汤逊湖北路38号光谷总部空间
出版文献量(篇)
286
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