Method for in situ calibration of multiple feedback interferometers
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摘要:
A method is presented for in situ resolution calibration of multiple feedback interferometers (MFIs) using two lasers with different feedback levels simultaneously.The laser with weak optical feedback level generates half-wavelength optical fringes,whereas the laser with strong multiple feedback level generates optical nanofringes.By using this method,the number of displaced optical nano-fringes can be easily counted,and the resolution of the MFIs can be accurately determined.The integrated MFIs can be used to measure displacements and calibrate other displacement sensors.