Phase Identification Using Series of Selected Area Diffraction Patterns and Energy Dispersive Spectrometry within TEM

• 作者: Kun-Lin Lin
• 来源期刊: 显微镜研究(英文)
• 学科: 化学
• 关键词: Phase Identification Transmission Electron MICROSCOPY SELECTED Area DIFFRACTION Pattern Energy DISPERSIVE SPECTROSCOPY
• 年，卷（期）: 2014,（4）
• 页码范围: 57-66
• 页数: 10页
• 分类号: O6

摘要

Transmission electron microscopy (TEM) is a very powerful technique for materials characteriza-tion, providing information relating to morphology, composition, and crystal structure. Selected area diffraction patterns (SADPs) are crystallographic data that can be obtained using a TEM in-strument. Conventional identification through SADP/TEM is tricky and tedious, thereby increasing the difficulty of phase identification. To establish a procedure for phase identification of known and unknown phases, in this study we examined two samples: one, a known phase, was Si with alignment;the other, unknown, was the TixOy phase at the 96.4Au-3Ni-0.6Ti interlayer/ yttria-stabilized zirconia (YSZ) interface of a steel/96.4Au-3Ni-0.6Ti interlayer/YSZ joint. The procedures for phase identification of the known and unknown phases are described herein using a series of SADPs and energy dispersive spectrometry within TEM that would be useful for general researchers.