The exponential weighted moving average technique used in process mean and variance monitoring charts was combined by Gan in 1997 and proposed two combined joint monitoring schemes one with rectangular control region and the other with elliptical control region. Performance of these two schemes may very depend on the shifts in mean or variance to be detected quickly. In this paper, performances of these two schemes are evaluated with respect to the average run length properties. The results reveal that elliptical scheme is little faster in detecting the shifts in process mean and increase in variance within a limit.