篇名 | Characterization of tetragonal distortion in a thick Al0.2Ga0.8N epilayer with an AlN interlayer by Rutherford backscattering/channeling | ||
来源期刊 | 中国物理B(英文版) | 学科 | |
关键词 | AlGaN Rutherford backscattering/channeling elastic strain | ||
年,卷(期) | 2014,(9) | 所属期刊栏目 | |
研究方向 | 页码范围 | 354-357 | |
页数 | 4页 | 分类号 | |
字数 | 语种 | 中文 | |
DOI | 10.1088/1674-1056/23/9/096801 |