Investigation of the Effect of Film Thickness and Heat Treatment on the Optical Properties of TeSeSn Thin Films

• 作者: A. Elwhab B. Alwany M. A. Abdel-Rahim M. M. Hafith Mohammed A. Algradee O. M. Samir
• 来源期刊: 凝固态物理国际期刊(英文)
• 学科: 物理学
• 关键词: THIN FILM FILM Thickness ANNEALING Temperature OPTICAL Properties
• 年，卷（期）: ngtwlgjqkyw_2015,（3）
• 页码范围: 220-231
• 页数: 12页
• 分类号: O48

摘要

Glassy substrates TeSeSn thin films were thermally evaporated onto chemically cleaned glass. The as-deposited (as-prepared) and annealed thin films were characterized by scanning electron microscopy (SEM), X-ray diffraction (XRD) and optical transmission. The optical absorption of the as-prepared and annealed TeSeSn thin films is studied in the wavelength range of 300 nm - 900 nm. The direct optical energy gap (Eg) increases from 1.989 to 2.143 eV with increasing the thickness of the as-prepared films from 100 to 200 nm. The annealed TeSeSn films showed a decrease in the optical energy gap with increasing the annealing temperature. The effect of heat treatment on the lattice dielectric constant (εL) and carrier concentration (N) are also studied.