篇名 | Different charging behaviors between electrons and holes in Si nanocrystals embedded in SiNx matrix by the influence of near-interface oxide traps | ||
来源期刊 | 中国物理B(英文版) | 学科 | |
关键词 | silicon nanocrystals memory different charging of electrons and holes oxide traps admittance-voltage characteristics | ||
年,卷(期) | 2015,(1) | 所属期刊栏目 | |
研究方向 | 页码范围 | 457-461 | |
页数 | 5页 | 分类号 | |
字数 | 语种 | 中文 | |
DOI | 10.1088/1674-1056/24/1/017305 |