When energetic ions interact with solid surfaces,sputtered ions are produced[1].The normalized distribution function F(m,q,vx,vy,vz)of the ions mass numbers m,charge states q and velocity(vx,vy,vz)in Cartesian coordinate represents kinematical information,and therefore carries important dynamical information of the sputtering process.A new instrument that is able to collect all the outgoing sputtered ions with 2Πsolid angle and subsequently can measure F(m,q,vx,vy,vz)is developed.The spectrometer structure is illustrated,the mathematical basis is presented and an algebraic algorithm is employed to calculate F(m,q,vx,vy,vz)numerically.