In this paper,the stability of latent tracks induced by swift heavy ions(SHIs)in mica was investigated under the electron bombardment during the transmission electron microscopy(TEM)examination.Prior to TEM observation,muscovite mica sheets with a thickness of 12μm were irradiated with Kr and Bi ions with electronic energy loss(dE/dx)e of 5.9 keV/nm and 31.5 keV/nm,respectively.The applied ion fluences for Kr and Bi ions were kept at 1×10^12 and 5×10^11 ions/cm^2.