DETECTION OF ELECTROMAGNETIC INCLUSIONS USING TOPOLOGICAL SENSITIVITY

• 来源期刊: 计算数学（英文版）
• 关键词: Electromagnetic imaging Topological derivative Localization Resolution analysis Stability analysis Medium noise Measurement noise
• 年，卷（期）: 2017,（5）
• 页码范围: 642-671
• 页数: 30页
• 语种: 英文
• DOI: 10.4208/jcm.1609-m2016-0498

摘要

In this article,a topological sensitivity framework for far-field detection of a diametrically small electromagnetic inclusion is established.The cases of single and multiple measurements of the electric far-field scattering amplitude at a fixed frequency are taken into account.The performance of the algorithm is analyzed theoretically in terms of its resolution and sensitivity for locating an inclusion.The stability of the framework with respect to measurement and medium noises is discussed.Moreover,the quantitative results for signal-to-noise ratio are presented.A few numerical results are presented to illustrate the detection capabilities of the proposed framework with single and multiple measurements.