Refractive index measurement of dielectric samples using highly focused radially polarized light(Invited Paper)

• 来源期刊: 中国光学快报（英文版）
• 年，卷（期）: 2017,（3）
• 页码范围: 12-15
• 页数: 4页
• 语种: 英文
• DOI: 10.3788/COL201715.030004

摘要

In this Letter,a refractive index measurement of a dielectric sample using highly focused radially polarized light is reported.Through imaging analysis of the optical field at the pupil plane of a high numerical aperture (NA)objective lens reflected by the sample under study,the Brewster angle is found.Employing a high NA objective lens allows the measurement of multiple angles of incidence from 0° to 64° in a single shot.The refractive index of the sample is estimated using the measured Brewster angle.The experimental results are compared with the theoretical images computed with the Fresnel theory,and a good agreement is obtained.