Lead-free perovskites for X-ray detecting

• 来源期刊: 科学通报（英文版）
• 年，卷（期）: 2017,（22）
• 页码范围: 1491-1493
• 页数: 3页
• 语种: 英文

摘要

X-ray detection is of great importance for computed tomography scanning,security inspection,non-destructive testing of industrial products and other detection applications [1,2].Due to the potential cancer risk caused by X-ray inspection,there is always room to achieve X-ray detectors with even better sensitivity and detection limit.There are two available approaches detecting X-rays,the first is indirect conversion using scintillators to convert X-ray photons into light and then a photodiode to convert light into charges;the other is direct conversion of X-ray photons into electrical current [3].The drawback of scintillator-based detectors is the light scattering in active layer and thereby image blurring [4].The direct conversion through amorphous or crystalline semiconductors effectively overcomes such shortcoming,and also enables high sensitivity and low detection limit due to a simpler system configuration [5].