Research on EMI Noise Measurement Technology Based on Wavelet Analysis

• 作者: Long Zaiyun Xu Li
• 来源期刊: 电子研究与应用
• 学科: 工学
• 关键词: ELECTROMAGNETIC interference(EMI)measurement WAVELET analysis frequency DIVISION filter THRESHOLD function
• 年，卷（期）: 2018,（1）
• 页码范围: 1-6
• 页数: 6页
• 分类号: TN9

摘要

Aiming at the problem that it is difficult to measure the electromagnetic radiation produced by the equipment at present,this paper presents a method for measuring the noise of electromagnetic interference(EMI)based on wavelet analysis.The technique uses time frequency localization features of the wavelet transform,based on threshold function filtering method to filter the test signal,which makes it possible in open space or noisy environment for measurement of electromagnetic interference of equipment.Simulation and experimental results show that the technique is able to eliminate or attenuate the noise in the frequency band of 30Hz~1000MHz.