Quantitative nanoscale mapping of three-phase thermal conductivities in filled skutterudites via scanning thermal microscopy

• 来源期刊: 国家科学评论（英文版）
• 关键词: thermal conductivity scanning thermal microscopy thermoelectric materials nanoscale heat transfer thermal imaging
• 年，卷（期）: 2018,（1）
• 页码范围: 59-69
• 页数: 11页
• 语种: 英文
• DOI: 10.1093/nsr/nwx074

摘要

In the last two decades,a nanostructuring paradigm has been successfully applied in a wide range of thermoelectric materials,resulting in significant reduction in thermal conductivity and superior thermoelectric performance.These advances,however,have been accomplished without directly investigating the local thermoelectric properties,even though local electric current can be mapped with high spatial resolution.In fact,there still lacks an effective method that links the macroscopic thermoelectric performance to the local microstructures and properties.Here,we show that local thermal conductivity can be mapped quantitatively with good accuracy,nanometer resolution and one-to-one correspondence to the microstructure using a three-phase skutterudite as a model system.Scanning thermal microscopy combined with finite element simulations demonstrate close correlation between sample conductivity and probe resistance,enabling us to distinguish thermal conductivities spanning orders of magnitude,yet resolving thermal variation across a phase interface with small contrast.The technique thus provides a powerful tool to correlate local thermal conductivities,microstructures and macroscopic properties for nanostructured materials in general and nanostructured thermoelectrics in particular.