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摘要:
Due to the high hygroscopicity of the plastic packaging material, the device is inevitably subjected to high temperature or high humidity environment during the production and testing process. After the moisture is expanded, the internal stress is too large, and the delamination and gold wire breakage are formed. At the same time, due to the difference in the coefficient of thermal expansion (CTE) between the plastic packaging material and the materials such as Si and Cu, it is easy to form delamination under a relatively large shear force. The water vapor remaining in the plastic packaging material is the root cause of delamination, and the reflow process and temperature are the predisposing factors leading to delamination. However, it has been found through experiments that different plastic packaging materials have different hygroscopicity and cohesiveness, and they have obvious improvement effects on delamination.
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篇名 Analysis of the Influence of Different Plastic Packaging Materials on Product Delamination of IC Components
来源期刊 现代电子技术(英文) 学科 工学
关键词 PLASTIC PACKAGE HYGROSCOPICITY COHESIVENESS Stress DELAMINATION IMPROVEMENT
年,卷(期) 2019,(1) 所属期刊栏目
研究方向 页码范围 1-5
页数 5页 分类号 TN
字数 语种
DOI
五维指标
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研究主题发展历程
节点文献
PLASTIC
PACKAGE
HYGROSCOPICITY
COHESIVENESS
Stress
DELAMINATION
IMPROVEMENT
研究起点
研究来源
研究分支
研究去脉
引文网络交叉学科
相关学者/机构
期刊影响力
现代电子技术(英文)
其它
2591-7129
12 Eu Tong Sen Stree
出版文献量(篇)
45
总下载数(次)
0
总被引数(次)
0
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