Imaging method of single layer graphene on metal substrate based on imaging ellipsometer with large field of view

• 来源期刊: 中国光学快报（英文版）
• 年，卷（期）: 2019,（1）
• 页码范围: 36-38
• 页数: 3页
• 语种: 英文
• DOI: 10.3788/COL201917.011201

摘要

Single layer lattice graphene deposited on the metal substrate can hardly be imaged by the optical microscope.In this Letter,a large field-of-view imaging ellipsometer is introduced to image single layer graphene which is deposited on a metal substrate.By adjusting the polarizer and the analyzer of imaging ellipsometer,the light reflected from surfaces of either single layer graphene or a Au film substrate can be extinguished,respectively.Thus,single layer graphene can be imaged correspondingly under brightfield or darkfield imaging modes.The method can be applied to imaging large-area graphene on a metal substrate.