The power conversion efficiency(PCE)for perovskite sol-ar cells(PSCs)now reaches 25.2%[1].However,the perovskite materials have complex compositions and variable phases,calling for suitable characterization techniques to investigate the underlying operation and degradation mechanism.Graz-ing-incidence wide-angle X-ray scattering(GIWAXS)plays an important role in studying perovskite materials.GIWAXS data are generally two-dimensional diffractograms containing dif-fraction rings of different crystal planes.Grazing-incidence small-angle X-ray scattering(GISAXS)is similar to GIWAXS,while it has a longer detection distance than that of GIWAXS(Fig.1(a))[2].GISAXS enlarges the observable spatial range up to 10-100 nm and reduces the measurement sensitivity of crys-tallization,and it is mainly used to determine the morpho-logy of bulk-heterojunction films in nanoscale[3,4].Compared to GISAXS,GIWAXS is more popular in perovskite study.This technique has several advantages as follows:(1)high signal-to-noise ratio(SNR)and sensitive structural resolution;(2)no-contact and nondestructive probing;(3)abundant structural in-formation;(4)depth resolution;(5)in-situ observation.Here,we discuss two applications of GIWAXS,i.e.,the crystallograph-ic information at steady state,and the in-situ measurement to probe the temporal information.As an important structur-al parameter of perovskite films,crystallographic orientation affects the optoelectronic properties and materials stability.The 2D GIWAXS diffractogram presents the Debye-Scherrer ring for certain crystallographic plane,enabling characteriza-tion of structural orientation of perovskite films.The orienta-tion degree for crystal planes can be obtained quantitatively according to the diffraction rings along the azimuth by using Herman's orientation function.