Tungsten oxides are interesting for a variety of applications due to their versatile optoelectronic charac-teristics,which can be tuned changing the composition and/or the crystalline structure.Coloration due to sub-bandgap absorption is often achieved by ion intercalation or doping in WO3:M films(with M=H+,Li+,Na+,etc.introducing extra electrons),but a more direct way is creating charged oxygen vacancies(Vo+and/or Vo2+)in sub-stoichiometric WO3-x forms.Here,amorphous WO3-x thin films are obtained by reactive DC sputtering of a pure W target,on unheated glass substrates,changing the oxygen to argon pressures ratio.The control of intrinsic defects(oxygen vacancies and tungsten valence states)by the oxy-gen partial pressure allows tuning the morphology,sub-bandgap absorption and carrier density in these WO3-x films,as it is proven by Raman spectroscopy,atomic force microscopy,optical spectrophotometry and Hall effect measurements.