[ 篇名 ] ADVANCED LASER APPLICATIONS IN MICROELECTRONICS AND DATA STORAGE DEVICES(INVITED),[ 篇名] ANNEALING TEMPERATURE DEPENDENCE OF CONTACT RESISTANCE AND STABL1TY FOR Ti/AI/Pt/Au OHMIC CONTACTS TO BULK n=ZaO,[篇名] Applications of thermography in the assessment of masonry, airport pavements and composite materials,[篇名 ] Bulk Plasma Production Using Gaseous Discharge System with External Electron Injection,[篇名] Characterization Of Nano-Meter Scale Roughness Of CVD Silicon And Silicon Dioxide Films For 3-D Device Integration,[ 篇名 ] CLEANING OF THE SURFACE OF SILICON STRUCTURES IN THE TECHNOLOGY OF VERY LARGE-SCALE INTEGRATED CIRCUITS WITH THE USE OF RAPID HEAT TREATMENT,[篇名] Effects of active elements on oxide removal by a vacuum arc。