Δ<i>I<sub>DDQ</sub></i>Testing of a CMOS Digital-to-Analog Converter Considering Process Variation Effects

• 作者: Ashok Srivastava Rajiv Soundararajan Siva Sankar Yellampalli
• 来源期刊: 电路与系统(英文)
• 学科: 医学
• 关键词: IDDQ TESTING DAC BICS Sub-Micron CMOS IC ΔIDDQ TESTING Process Variation Background Current
• 年，卷（期）: 2011,（3）
• 页码范围: 133-138
• 页数: 6页
• 分类号: R73

摘要

In this paper, we present the implementation of a built-in current sensor (BICS) which takes into account the increased background current of defect-free circuits and the effects of process variation on ΔIDDQ testing of CMOS data converters. A 12-bit digital-to-analog converter (DAC) is designed as the circuit under test (CUT). The BICS uses frequency as the output for fault detection in CUT. A fault is detected if it causes the output frequency to deviate more than ±10% from the reference frequency. The output frequencies of the BICS for various (MOSIS) model parameters are simulated to check for the effect of process variation on the frequency deviation. A set of eight faults simulating manufacturing defects in CMOS data converters are injected using fault-injection transistors and tested successfully.