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摘要:
Crystalline and non-crystalline nickel oxide (NiO) thin films were obtained by spray pyrolysis technique (SPT) using nickel acetate tetrahydrate solutions onto glass substrates at different temperatures from 225 to 350℃. Structure of the as-deposited NiO thin films have been examined by X-ray diffraction (XRD) and atomic force microscope (AFM). The results showed that an amorphous structure of the films at low substrate temperature (Ts = 225℃), while at higher Ts ≥ 275℃, a cubic single phase structure of NiO film is formed. The refractive index (n) and the extinction coefficient (k) have been calculated from the corrected transmittance and reflectance measurements over the spectral range from 250 to 2400 nm. Some of the optical absorption parameters, such as optical dispersion energies, Eo and Ed, dielectric constant, ε, the average values of oscillator strength, So, wavelength of single oscillator λo and plasma frequency, ωp, have been evaluated.
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篇名 Structural and Optical Dispersion Characterisation of Sprayed Nickel Oxide Thin Films
来源期刊 现代物理(英文) 学科 化学
关键词 NICKEL Oxide Thin Films NICKEL ACETATE Optical DISPERSION SPRAY PYROLYSIS Technique AFM XRD
年,卷(期) 2011,(10) 所属期刊栏目
研究方向 页码范围 1178-1186
页数 9页 分类号 O6
字数 语种
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研究主题发展历程
节点文献
NICKEL
Oxide
Thin
Films
NICKEL
ACETATE
Optical
DISPERSION
SPRAY
PYROLYSIS
Technique
AFM
XRD
研究起点
研究来源
研究分支
研究去脉
引文网络交叉学科
相关学者/机构
期刊影响力
现代物理(英文)
月刊
2153-1196
武汉市江夏区汤逊湖北路38号光谷总部空间
出版文献量(篇)
1826
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0
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