Elimination of bistability in constant-phase mode in atomic force microscopy

• 来源期刊: 科学通报(英文版)
• 学科: 工学
• 年，卷（期）: 2012,（5）
• 页码范围: 460-465
• 页数: 6页
• 分类号: TH742
• 语种: 中文

摘要

By presenting the phase properties of bistability in amplitude-modulation atomic force microscopy, we put forward a technique, the constant-phase mode, which may eliminate bistability. Using this approach, we keep the phase shift between driving and oscillation constant, slightly above -90°. In addition to the adjustment of the free amplitude, we add to amplitude-modulation atomic force microscopy another feedback so that the tip always oscillates in the high-amplitude state. A numerical simulation is carried out to demonstrate that the algorithm prevents bistability effectively.