<i>In-Situ</i>Monitoring of Chemical Vapor Deposition from Trichlorosilane Gas and Monomethylsilane Gas Using Langasite Crystal Microbalance

• 作者: Hitoshi Habuka Yurie Tanaka
• 来源期刊: 表面工程材料与先进技术期刊(英文)
• 学科: 医学
• 关键词: Chemical Vapor Deposition IN-SITU Measurement LANGASITE CRYSTAL MICROBALANCE
• 年，卷（期）: bmgcclyxjjsqkyw_2013,（1）
• 页码范围: 61-66
• 页数: 6页
• 分类号: R73

摘要

Using the langasite crystal microbalance (LCM), the trends in film thickness produced by means of the chemical vapor deposition using trichlorosilane gas, monomethylsilane gas and their mixed gas were observed at 600?C and evaluated by comparison with the information from a transmission electron microscope (TEM). The crystalline silicon film thickness from trichlorosilane gas was comparable to that of an amorphous silicon carbide film from monomethylsilane gas. The film obtained from the gas mixture was amorphous and was the thinnest in this study. Because the thickness trend obtained by the LCM agreed with that by the TEM, the LCM is shown to be a convenient evaluation tool for the behavior of various film deposition.