The Effect of Light on the CVC of Strained p-n-Junction in a Strong Microwave Field

• 作者: Muhammadjon Gulomkodirovich Dadamirzaev
• 来源期刊: 现代物理(英文)
• 学科: 医学
• 关键词: Hot Electrons and Holes The Microwave Field p-n-Junction LIGHT PHOTOCURRENT Lasing and Recombination Currents Deformation CVC Strain p-n-Junction
• 年，卷（期）: xdwlyw_2015,（15）
• 页码范围: 2275-2279
• 页数: 5页
• 分类号: R73

摘要

For the first time the effect of light on the CVC of strained p-n-junction in a strong microwave field is examined. It is shown that the deformation and the microwave field increase the current through p-n-junction, and the light decreases it. The mechanism of this phenomenon is explained by the fact that under heating of the charge carriers by microwave field the recombination current arises, and under the action of light the generation current arises which are directed oppositely. And under the influence of the deformation the band gap of the semiconductor will be changed.