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<span style="font-family:Verdana;">This manuscript presents a simple method for excess minority carriers’ lifetime measurement</span><span style="font-family:""> </span><span style="font-family:""><span style="font-family:Verdana;">within the base region of p-n junction polycrystalline solar </span><span style="font-family:Verdana;">cell</span></span><span style="font-family:""> </span><span style="font-family:Verdana;">in transient mode.</span><span style="font-family:""> </span><span style="font-family:Verdana;">This work is an experimental transient</span><span style="font-family:Verdana;"> 3-Dimensionnal study.</span><span style="font-family:""> </span><span style="font-family:Verdana;">The magnitude of the magnetic field B is varied from 0 mT to 0.045 mT. Indeed, the solar cell is illuminated by a stroboscopic flash with air mass 1.5</span><span style="font-family:""> </span><span style="font-family:Verdana;">and under magnetic field in transient state.</span><span style="font-family:""> </span><span style="font-family:Verdana;">The experimental details are assumed in a figure. The procedure is outlined by the Open Circuit Voltage Decay analysis. Effective minority carrier life-time is calculated by fitting the linear zone of the transient voltage decay curve</span><span style="font-family:""> </span><span style="font-family:Verdana;">because linear decay is an ideal decay. The kaleidagraph software permits access to the slope of the curve which is inversely proportional to the</span><span style="font-family:""> </span><span style="font-family:Verdana;">lifetime. The external magnetic effects</span><span style="font-family:""> </span><span style="font-family:Verdana;">on minority carriers’ effective lifetime </span><span style="font-family:Verdana;">is</span><span style="font-family:Verdana;"> then</span><span style="font-family:""> </span><span style="font-family:Verdana;">presented and analyzed.</span><span style="font-family:""> </span><span style="font-family:Verdana;">The analysis show</span><span s
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篇名 Experimental Measurement of Minority Carriers Effective Lifetime in Silicon Solar Cell Using Open Circuit Voltage Decay under Magnetic Field in Transient Mode
来源期刊 智能电网与可再生能源(英文) 学科 数学
关键词 Carrier Lifetime FITTING Magnetic Field Open Circuit Voltage Decay
年,卷(期) 2020,(11) 所属期刊栏目
研究方向 页码范围 181-190
页数 10页 分类号 O17
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Carrier
Lifetime
FITTING
Magnetic
Field
Open
Circuit
Voltage
Decay
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研究去脉
引文网络交叉学科
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期刊影响力
智能电网与可再生能源(英文)
月刊
2151-481X
武汉市江夏区汤逊湖北路38号光谷总部空间
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13
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