Measuring the Interfacial Thickness of Immiscible Polymer Blends by Nano-probing of Atomic Force Microscopy

• 作者: Tian-Tian Li Si-Bo Cheng Lian-Fang Feng Xue-Ping Gu Cai-Liang Zhang Guo-Hua Hu
• 来源期刊: 高分子科学（英文版）
• 年，卷（期）: 2022,（4）
• 所属期刊栏目: RESEARCH ARTICLES
• 页码范围: 421-430
• 页数: 10页
• 语种: 英文

摘要

Immiscible polymer blends are an important family of polymer materials.The interfacial thickness between different phases is a very important parameter that dictates,to a great extent,the morphology and properties of such a blend.This work explores and optimizes an up-to-date atomic force microscopy(AFM)of type NanoIR2TM system in order to quantitatively measure the interfacial thickness of immiscible polymer blends.This system is equipped with two nano-probes capable of detecting the response of a material to an infrared pulse called AFM-infrared spectroscopy mode(AFM-IR)or conducting resonance called AFM-Lorentz Contact Resonance mode(AFM-LCR),respectively.Its potential for quantitatively measuring the interfacial thickness of immiscible polymer blends is evaluated using blends composed of polyamide 6(PA6)and polyolefin elastomer(POE)in the presence or absence of a POE containing maleic anhydride(POE-g-MAH)as a compatibilizer.Surface roughness affects adversely the signal intensity and consequently an accurate measurement of the interfacial thickness.Optimum sample surface preparation procedures are proposed.