PRECISE MEASUREMENT OF DENSITY-DEPENDENT SHIFT BY WAVELENGTH MODULATION REFLECTION SPECTROSCOPY

• 来源期刊: 中国物理(英文版)
• 学科: 物理学
• 关键词: selective reflection sub-Doppler wavelength modulation spectroscopy harmonic detection
• 年，卷（期）: 2001,（8）
• 页码范围: 716-719
• 页数: 4页
• 分类号: O4
• 语种: 英文

摘要

The density dependence of the line shift of the cesium D2 line is studied with sub-Doppler selective reflection spectroscopy. By use of wavelength modulation and sixth-harmonics detection we observed the coefficient of the pressureinduced shift of the 6S1/2(F=4)→6P3/2(F＇=3) hyperfine transition of the cesium D2 line △δ/p=-0.9(5)×10-8cm3.In the limit ρ=0 a frequency shift about -3MHz remains, which may be attributed to long-range atom-surface interactions. The experimental results can be used in measurements of the local field-induced frequency shift at high atomic densities with sufficient accuracy.