Reflectivity of W/Si Multilayer at the Photo-energies of 700 eV and 1200 eV
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摘要:
We have deposited W/Si multilayer mirrors using magnetron sputtering, and measured their reflectivity at the Beijing Synchrotron Radiation Facility. The W/Si multilayer mirrors show a peak reflectivity of approximately 10% at a photo-energy of 1200eV and 10.5% at a photo-energy of 700eV at an incidence angle of 81°. So far, no higher reflectivity than that given in this letter has been reported.