Field-ion microscopy observation of single-walled carbon nanotubes

• 来源期刊: 中国物理（英文版）
• 学科: 物理学
• 关键词: field-ion microscopy carbon nanotubes
• 年，卷（期）: 2002,（8）
• 页码范围: 804-808
• 页数: 5页
• 分类号: O4
• 语种: 英文

摘要

Field-ion microscopy (FIM), a tool for surface analysis with atomic resolution, has been employed to observethe end structure of single-walled carbon nanotubes (SWCNTs). FIM images revealed the existence of open SWCNTends. Amorphous carbon atoms were also observed to occur around SWCNTs and traditional field evaporation failedto remove them. Heat treatment was found to be efficacious in altering the end structures of SWCNT bundles. Carbonand oxygen atoms released from heated tungsten filament are believed to be responsible for the decoration imposed onthe SWCNT ends.