The Experimental Analysis of Cross-talk Effect for Mixed-mode IC＇s Based on SOI Structure

• 作者: HUANGRu WANGYangyuan ZHANGGuoyan ZHANGXing
• 来源期刊: 电子学报(英文版)
• 学科: 工学
• 关键词: 串话干扰 混合模式集成电路 SOI 硅上绝缘体 接触面积 间距 护圈隔离
• 年，卷（期）: 2004,（1）
• 页码范围: 79-81
• 页数: 3页
• 分类号: TN405
• 语种: 中文

摘要

The experimental study of cross-talk behavior is presented for mixed-mode integrated circuits based on SOI (Silicon-on-insulator) structure. Different strategies to reduce cross-talk are investigated. The influence of bulk contact, separation distance, the guard ring isolation and mesa isolation on the cross-talk has been compared. At the same time, the effect of load impedance on the cross-talk is also included. The results can serve as a guideline for designing low-noise coupling SOI mixed-mode IC''''s.