Incident angle dependence of secondary electron emission from carbon induced by swift H2+

• 来源期刊: 中国物理（英文版）
• 关键词: secondary electron emission incidence angle Monte-Carlo simulation valence electron statistical distribution
• 年，卷（期）: 2005,（7）
• 页码范围: 1465-1470
• 页数: 6页
• 语种: 英文

摘要

The incident angle dependence of secondary electron emission induced by a swift H2+ ion impinging on carbon is studied using the Monte Carlo method combined with the semiempirical theory. The relationships both between the electron emission yield and the project angle and between the statistics and the projectile angle are investigated. The results show that the backward electron emission yield deviates from the inverse cosine law, due to the effect of the valence electrons of H2+. The ratio of the forward electron emission yield to the backward electron emission yield at the inclining incidence is different from that at the normal incidence. The statistical distribution of electron emission is independent of the incident angle. The value of b, the deviation parameter from the Poisson distribution, increases with projectile energy.