| 篇名 | Semi-quantitative study on the Staebler-Wronski effect of hydrogenated amorphous silicon films prepared with HW-ECR-CVD system | ||
| 来源期刊 | 中国物理(英文版) | 学科 | |
| 关键词 | hydrogenated amorphous silicon Staebler-Wronski effect microwave electron cyclotron resonant chemical vapour deposition charged defects | ||
| 年,卷(期) | 2006,(4) | 所属期刊栏目 | |
| 研究方向 | 页码范围 | 813-817 | |
| 页数 | 5页 | 分类号 | |
| 字数 | 语种 | 英文 | |
| DOI | |||