Influence of the probe-sample interaction on scanning near-field optical microscopic images in the far field

• 来源期刊: 中国物理（英文版）
• 关键词: SNOM probe-sample interaction near-field scanning optical microscopy
• 年，卷（期）: 2006,（11）
• 页码范围: 2558-2563
• 页数: 6页
• 语种: 英文

摘要

We have studied the influence of probe-sample interaction in a scanning near-field optical microscopy (SNOM) in the far field by using samples with a step structure. For a sample with a step height of ～λ/4, the SNOM image contrast between the two sides of the step changes periodically at different scan heights. For a step height of ～λ/2, the image contrast remains approximately the same. The probe-sample interaction determines the SNOM image contrast here. The influence of different refractive indices of the sample has been also analysed by using a simple theoretical model.