Neutralization process of Xeq+ ion grazing on Al(111) surface

• 来源期刊: 中国物理（英文版）
• 关键词: slow highly charged ion hollow atom grazing incidence
• 年，卷（期）: 2007,（10）
• 页码范围: 2918-2923
• 页数: 6页
• 语种: 英文

摘要

A code has been developed to simulate the neutralization and grazing process of slow highly charged ion Xeq+ on Al(111) surface under the classical-over-the-barrier model. The image energy gain of Xeq+ ions are calculated and compared with experiment data. The simulation results of image energy gain are in good agreement with the experiment data. Meanwhile, in the present work, the reflection coefficient of incident Xeq+ on Al(111) surface as a function of the incidence angle, energy and charge state is also studied.